2013年3月
Precise and nondestructive characterization of a 'buried' nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering
POLYMER JOURNAL
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- 巻
- 45
- 号
- 3
- 開始ページ
- 307
- 終了ページ
- 312
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1038/pj.2012.133
- 出版者・発行元
- NATURE PUBLISHING GROUP
Nanoimprint lithography (NIL) is a simple and high-resolution patterning method. Nanoimprinted structures can be fabricated not only as surface structures but also as 'buried' structures for applications such as electro-optical devices. However, a precise and nondestructive evaluation method for nanoimprinted structures has not yet been established. Synchrotron radiation ultrasmall angle X-ray scattering (SR-USAXS) is a nondestructive and high-resolution characterization method. In this study, we fabricated nanostructures on a poly(lactic acid) (PLA) film using NIL. In addition, the nanoimprinted PLA film was covered with a polystyrene thin film to fabricate a 'buried' structure. The fabricated surface and the 'buried' structure were evaluated using SR-USAXS. The scattering pattern was clearly obtained from the surface and the 'buried' structure. The size of the 'buried' structure, which was estimated from the diffraction pattern, was in good agreement with that of the surface structure. These results indicate that SR-USAXS is powerful tool for the nondestructive and precise characterization of surface and 'buried' structures. Polymer Journal (2013) 45, 307-312; doi:10.1038/pj.2012.133; published online 27 June 2012
- リンク情報
- ID情報
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- DOI : 10.1038/pj.2012.133
- ISSN : 0032-3896
- eISSN : 1349-0540
- Web of Science ID : WOS:000317090400011