論文

査読有り
2016年9月

Reduction of cross-talks between circuit and sensor layer in the Kyoto's X-ray astronomy SOI pixel sensors with Double-SOI wafer

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
  • Shunichi Ohmura
  • ,
  • Takeshi Go Tsuru
  • ,
  • Takaaki Tanaka
  • ,
  • Hiroyuki Uchida
  • ,
  • Ayaki Takeda
  • ,
  • Hideaki Matsumura
  • ,
  • Makoto Ito
  • ,
  • Yasuo Arai
  • ,
  • Ikuo Kurachi
  • ,
  • Toshinobu Miyoshi
  • ,
  • Shinya Nakashima
  • ,
  • Koji Mori
  • ,
  • Yusuke Nishioka
  • ,
  • Nobuaki Takebayashi
  • ,
  • Koki Noda
  • ,
  • Takayoshi Kohmura
  • ,
  • Kouki Tamasawa
  • ,
  • Yusuke Ozawa
  • ,
  • Tadashi Sato
  • ,
  • Takahiro Konno
  • ,
  • Shoji Kawahito
  • ,
  • Keiichiro Kagawa
  • ,
  • Keita Yasutomi
  • ,
  • Hiroki Kamehama
  • ,
  • Sumeet Shrestha
  • ,
  • Kazuhiko Hara
  • ,
  • Shunsuke Honda

831
開始ページ
61
終了ページ
64
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.nima.2016.04.024
出版者・発行元
ELSEVIER SCIENCE BV

We have been developing silicon-on-insulator pixel sensors, "XRPIXs," for future X-ray astronomy satellites. XRPIXs are equipped with a function of "event-driven readout," with which we can read out only hit pixels by trigger signals and hence realize good time resolution reaching-10 is. The current version of XRPIX suffers from a problem that the spectral performance degrades in the event-driven readout mode compared to the frame-readout mode, in which all the pixels are read out serially. Previous studies have clarified that one of the causes is capacitive coupling between the sense node and the trigger signal line in the circuit layer. In order to solve the problem, we adopt the Double SOI structure having a middle silicon layer between the circuit and the sensor layers. We expect the middle silicon layer to work as an electrostatic shield and reduces the capacitive coupling. In this paper, we report the spectroscopic performance of XRPIX with the middle silicon layer. We successfully reduce the capacitive coupling and the readout noise. (C) 2016 Elsevier B.V. All rights reserved.

Web of Science ® 被引用回数 : 11

リンク情報
DOI
https://doi.org/10.1016/j.nima.2016.04.024
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000382255800013&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.nima.2016.04.024
  • ISSN : 0168-9002
  • eISSN : 1872-9576
  • Web of Science ID : WOS:000382255800013

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