2011年
Surface Micro-XAFS and Its Application to Real-time Observation of Organic Thin Films
Journal of Surface Analysis
- ,
- ,
- ,
- 巻
- 17
- 号
- 3
- 開始ページ
- 333
- 終了ページ
- 336
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1384/jsa.17.333
- 出版者・発行元
- 一般社団法人 表面分析研究会
X-ray absorption fine structure (XAFS) is a powerful tool to investigate electronic structures, valence states and molecular orientations at solid surfaces. In order to observe nano-scaled dynamic phenomena at solid surfaces, we have developed a micro-XAFS system using a photoelectron emission microscopy (PEEM) excited by synchrotron radiation in soft X-ray region. Here we explain the performance of our system concentrating on the recent development of quick measurements, and demonstrated that a PEEM image can be taken in a short time down to 10 msec. As an application of the system, we present the results for the real-time mapping of molecular orientations at nanometer scale for organic thin films. We demonstrated that the orientations of organic molecules in a microscopic region change during surface diffusion.
- リンク情報
- ID情報
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- DOI : 10.1384/jsa.17.333
- ISSN : 1341-1756
- CiNii Articles ID : 130005138968
- CiNii Books ID : AA11448771