2002年
Grazing Incidence In-Plane X-Ray Diffraction Study on Oriented Copper Phthalocyanine Thin Films
Japanese journal of applied physics. Pt. 1, Regular papers & short notes
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- 巻
- 41
- 号
- 8
- 開始ページ
- 5467
- 終了ページ
- 5471
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1143/JJAP.41.5467
- 出版者・発行元
- 社団法人応用物理学会
Uniaxially aligned vacuum deposited films of copper phthalocyanine (CuPc) have been studied by means of angle-dispersive grazing-incidence X-ray diffraction. The lateral structure of the top surface of a 100-nm-thick film was successfully probed. It was revealed that the microcrystals near the surface have a finite in-plane distribution with a full-width at half maximum of 17.5°. In-plane diffraction profiles were transformed into a reciprocal space map that reproduced the electron diffraction pattern of a CuPc thin film reported previously.
- リンク情報
- ID情報
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- DOI : 10.1143/JJAP.41.5467
- ISSN : 0021-4922
- ISSN : 1347-4065
- CiNii Articles ID : 110006341757
- CiNii Books ID : AA10457675