論文

2023年2月

Tensile overload-induced texture effects on the fatigue resistance of a CoCrFeMnNi high-entropy alloy

ACTA MATERIALIA
  • Tu-Ngoc Lam
  • Hsu-Huan Chin
  • Xiaodan Zhang
  • Rui Feng
  • Huamiao Wang
  • Ching-Yu Chiang
  • Soo Yeol Lee
  • Takuro Kawasaki
  • Stefanus Harjo
  • Peter K. Liaw
  • An-Chou Yeh
  • Tsai-Fu Chung
  • E-Wen Huang
  • 全て表示

245
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.actamat.2022.118585
出版者・発行元
PERGAMON-ELSEVIER SCIENCE LTD

The present study investigates the crystallographic-texture effects on the improved fatigue resistance in the CoCrFeMnNi high-entropy alloys (HEAs) with the full-size geometry of the American Society for Testing and Materials (ASTM) Standards E647-99. We exploited X-ray nano-diffraction (XND) mapping to characterize the crystal-deformation levels ahead of the crack tip after stress unloading under both constant-and tensile-overloaded-fatigue conditions. The crack-tip blunting-induced much higher deformation level was concen-trated surrounding the crack-tip which delays the fatigue-crack growth immediately after a tensile overload. The predominant deformation texture orientation in the Paris regime was investigated, using electron backscatter diffraction (EBSD) and orientation distribution function (ODF) analyses. The twinning formation-driven shear deformation gave rise to the development of the Goss-type texture within the plastic deformation regime under a tensile-overloaded-fatigue condition, which was attributed to enhance the crack deflection and thus the tensile-induced crack-growth-retardation period in the CoCrFeMnNi HEA. Our new findings address the quantitative discrepancy found in our earlier work.

リンク情報
DOI
https://doi.org/10.1016/j.actamat.2022.118585
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000906751500001&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.actamat.2022.118585
  • ISSN : 1359-6454
  • eISSN : 1873-2453
  • Web of Science ID : WOS:000906751500001

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