論文

査読有り
2016年1月

Characteristics of Discharge Currents Measured through Body-Attached Metal for Modeling ESD from Wearable Electronic Devices

IEICE TRANSACTIONS ON COMMUNICATIONS
  • Takeshi Ishida
  • ,
  • Fengchao Xiao
  • ,
  • Yoshio Kami
  • ,
  • Osamu Fujiwara
  • ,
  • Shuichi Nitta

E99B
1
開始ページ
186
終了ページ
191
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1587/transcom.2015EBP3184
出版者・発行元
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

To investigate electrostatic discharge (ESD) immunity testing for wearable electronic devices, the worst scenario i.e., an ESD event occurs when the body-mounted device approaches a grounded conductor is focused in this paper. Discharge currents caused by air discharges from a charged human through a hand-held metal bar or through a semi-sphere metal attached to the head, arm or waist in lieu of actual wearable devices are measured. As a result, it is found that at a human charge voltage of 1 kV, the peak current from the semi-sphere metal is large in order of the attachment of the waist (15.4A), arm (12.8A) and head (12.2A), whereas the peak current (10.0A) from the hand-held metal bar is the smallest. It is also found that the discharge currents through the semi-sphere metals decrease to zero at around 50 ns regardless of the attachment positions, although the current through the hand-held metal bar continues to flow at over 90 ns. These discharge currents are further characterized by the discharge resistance, the charge storage capacitance and the discharge time constant newly derived from the waveform energy, which are validated from the body impedance measured through the hand-held and body-mounted metals. The above finding suggests that ESD immunity test methods for wearable devices require test specifications entirely different from the conventional ESD immunity testing.

リンク情報
DOI
https://doi.org/10.1587/transcom.2015EBP3184
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000374778800023&DestApp=WOS_CPL
ID情報
  • DOI : 10.1587/transcom.2015EBP3184
  • ISSN : 0916-8516
  • eISSN : 1745-1345
  • Web of Science ID : WOS:000374778800023

エクスポート
BibTeX RIS