論文

査読有り
2003年4月

Energy and angular distributions of secondary ions from a C-60 surface induced by fast heavy ion impacts

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
  • A Yogo
  • ,
  • T Majima
  • ,
  • A Itoh

203
開始ページ
141
終了ページ
145
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/S0168-583X(02)02199-7
出版者・発行元
ELSEVIER SCIENCE BV

We have measured energy and angular distributions of secondary ions emitted from a C-60 film target bombarded by 4-MeV Si-28(3+) ions by using a time-of-flight coincidence method. Fullerene-like secondary ions of C-60-2n(+) In and C-60+2n(+) (n = 1-5) as well C-60 ions and multiples of C-60 such as C-60N(+) (N = 2, 3) ions were observed strongly. It is found that the 60 angular distributions of Q ion are roughly symmetric with respect to the surface normal of the target. On the other 60 hand, the angular distribution of C-62 ions is found to be slightly inclined from the surface normal. The present result indicates that fullerene-like ions may be produced predominantly via the mechanism predicted by the pressure-pulse model developed for fast heavy ions. (C) 2003 Elsevier Science B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/S0168-583X(02)02199-7
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000182624600023&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/S0168-583X(02)02199-7
  • ISSN : 0168-583X
  • Web of Science ID : WOS:000182624600023

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