論文

査読有り 国際誌
2018年4月

Controlled fabrication of electrically contacted carbon nanoscrolls

Nanotechnology
  • Marek E. Schmidt
  • ,
  • Ahmed M.M. Hammam
  • ,
  • Takuya Iwasaki
  • ,
  • Teruhisa Kanzaki
  • ,
  • Manoharan Muruganathan
  • ,
  • Shinichi Ogawa
  • ,
  • Hiroshi Mizuta

29
23
開始ページ
235605
終了ページ
235605
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1088/1361-6528/aab82c

© 2018 IOP Publishing Ltd. Carbon nanoscrolls (CNS) with their open ended morphology have recently attracted interest due to the potential application in gas capture, biosensors and interconnects. However, CNS currently suffer from the same issue that have hindered widespread integration of CNTs in sensors and devices: formation is done ex situ, and the tubes have to be placed with precision and reliability - a difficult task with low yield. Here, we demonstrate controlled in situ formation of electrically contacted CNS from suspended graphene nanoribbons with slight tensile stress. Formation probability depends on the length to width aspect ratio. Van der Waals interaction between the overlapping layers fixes the nanoscroll once formed. The stability of these CNSs is investigated by helium nano ion beam assisted in situ cutting. The loose stubs remain rolled and mostly suspended unless subject to a moderate helium dose corresponding to a damage rate of 4%-20%. One CNS stub remaining perfectly straight even after touching the SiO2 substrate allows estimation of the bending moment due to van der Waals force between the CNS and the substrate. The bending moment of 5400 eV is comparable to previous theoretical studies. The cut CNSs show long-term stability when not touching the substrate.

リンク情報
DOI
https://doi.org/10.1088/1361-6528/aab82c
PubMed
https://www.ncbi.nlm.nih.gov/pubmed/29557785
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85045536323&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85045536323&origin=inward
ID情報
  • DOI : 10.1088/1361-6528/aab82c
  • ISSN : 0957-4484
  • eISSN : 1361-6528
  • PubMed ID : 29557785
  • SCOPUS ID : 85045536323

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