論文

査読有り
2017年7月

Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurements

ULTRAMICROSCOPY
  • Tomohiro Miyata
  • ,
  • Teruyasu Mizoguchi

178
開始ページ
81
終了ページ
87
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.ultramic.2016.10.009
出版者・発行元
ELSEVIER SCIENCE BV

Investigation of the local structure, ionic and molecular behavior, and chemical reactions at high spatial resolutions in liquids has become increasingly important. Improvements in these areas help to develop efficient batteries and improve organic syntheses. Transmission electron microscopy (TEM) and scanning-TEM (STEM) have excellent spatial resolution, and the electron energy-loss near edge structure (ELNES) measured by the accompanied electron energy-loss spectroscopy (EELS) is effective to analyze the liquid local structure owing to reflecting the electronic density of states. In this study, we fabricate a liquid-layer-only sample with thickness of single to tens nanometers using an ionic liquid. Because the liquid film has a thickness much less than the inelastic mean free path (IMFP) of the electron beam, the fine structure of the C-K edge electron energy loss near edge structure (ELNES) can be measured with sufficient resolution to allow meaningful analysis. The ELNES spectrum from the thin liquid film has been interpreted using first principles ELNES calculations.

リンク情報
DOI
https://doi.org/10.1016/j.ultramic.2016.10.009
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000403862900010&DestApp=WOS_CPL
URL
http://orcid.org/0000-0001-7352-9640
ID情報
  • DOI : 10.1016/j.ultramic.2016.10.009
  • ISSN : 0304-3991
  • eISSN : 1879-2723
  • ORCIDのPut Code : 44379017
  • Web of Science ID : WOS:000403862900010

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