2017年7月
Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurements
ULTRAMICROSCOPY
- ,
- 巻
- 178
- 号
- 開始ページ
- 81
- 終了ページ
- 87
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/j.ultramic.2016.10.009
- 出版者・発行元
- ELSEVIER SCIENCE BV
Investigation of the local structure, ionic and molecular behavior, and chemical reactions at high spatial resolutions in liquids has become increasingly important. Improvements in these areas help to develop efficient batteries and improve organic syntheses. Transmission electron microscopy (TEM) and scanning-TEM (STEM) have excellent spatial resolution, and the electron energy-loss near edge structure (ELNES) measured by the accompanied electron energy-loss spectroscopy (EELS) is effective to analyze the liquid local structure owing to reflecting the electronic density of states. In this study, we fabricate a liquid-layer-only sample with thickness of single to tens nanometers using an ionic liquid. Because the liquid film has a thickness much less than the inelastic mean free path (IMFP) of the electron beam, the fine structure of the C-K edge electron energy loss near edge structure (ELNES) can be measured with sufficient resolution to allow meaningful analysis. The ELNES spectrum from the thin liquid film has been interpreted using first principles ELNES calculations.
- リンク情報
- ID情報
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- DOI : 10.1016/j.ultramic.2016.10.009
- ISSN : 0304-3991
- eISSN : 1879-2723
- ORCIDのPut Code : 44379017
- Web of Science ID : WOS:000403862900010