MISC

査読有り
2007年

Moving-mask UV lithography for 3-dimensional positive- and negative-tone thick photoresist microstructuring

TRANSDUCERS '07 & EUROSENSORS XXI, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
  • Y. Hirai
  • ,
  • Y. Inamoto
  • ,
  • K. Sugano
  • ,
  • T. Tsuchiya
  • ,
  • O. Tabata

開始ページ
545
終了ページ
548
記述言語
英語
掲載種別
DOI
10.1109/SENSOR.2007.4300188
出版者・発行元
IEEE

This paper presents a systematic study on "Moving-mask UV lithography" for 3-D (three-dimensional) microstructuring of positive- and negative-tone thick photoresist and a dedicated UV lithography process simulation. As an application of the moving-mask UV lithography, we propose a novel method to fabricate embedded microfluidic structures Using SU-8. Furthermore, we propose a new practical photoresist profile simulation approach adopting the "Fast Marching Method" to consider the photoresist dissolution vector in the development process. Through a series of moving-mask UV lithography experiments, (1) the capability of the moving-mask UV lithography for 3-D microstructuring, and (2) the validity of the proposed photoresist profile simulation, were successfully confirmed.

リンク情報
DOI
https://doi.org/10.1109/SENSOR.2007.4300188
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000249603700132&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/SENSOR.2007.4300188
  • Web of Science ID : WOS:000249603700132

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