2016年10月
Development of hard X-ray dark-field microscope using full-field optics
JAPANESE JOURNAL OF APPLIED PHYSICS
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- 巻
- 55
- 号
- 10
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.7567/JJAP.55.102401
- 出版者・発行元
- IOP PUBLISHING LTD
We develop a dark-field X-ray microscope using full-field optics based on a synchrotron beamline. Our setup consists of a condenser system and a microscope objective with an angular acceptance larger than that of the condenser. The condenser system is moved downstream from its regular position such that the focus of the condenser is behind the objective. The dark-field microscope optics are configured by excluding the converging beam from the condenser at the focal point. The image properties of the system are evaluated by observing and calculating a Siemens star test chart with 10 keV X-rays. Our setup allows easy switching to bright-field imaging. (C) 2016 The Japan Society of Applied Physics
- リンク情報
- ID情報
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- DOI : 10.7567/JJAP.55.102401
- ISSN : 0021-4922
- eISSN : 1347-4065
- Web of Science ID : WOS:000385503600001