MISC

査読有り
2013年

Vacancy migration process in F82H and Fe-Cr binary alloy using positron annihilation lifetime measurement

16TH INTERNATIONAL CONFERENCE ON POSITRON ANNIHILATION (ICPA-16)
  • K. Sato
  • ,
  • Q. Xu
  • ,
  • D. Hamaguchi
  • ,
  • S. S. Huang
  • ,
  • T. Yoshiie

443
1
記述言語
英語
掲載種別
DOI
10.1088/1742-6596/443/1/012031
出版者・発行元
IOP PUBLISHING LTD

Microstructral evolution of electron-irradiated F82H and Fe-8%Cr at 77 K was studied using positron annihilation lifetime measurements. Irradiation-induced vacancies started to migrate at 300 K and 180 K in F82H and Fe-8%Cr, respectively. Solute Cr atoms did not suppress vacancy migration, but they made di-vacancies more stable. Microvoids were not formed by annealing. In F82H, solute atoms acted as trapping site of irradiation-induced defects and annihilation of vacancies and interstitials was facilitated. Pre-existing dislocations and precipitates were also their sinks. These lead to the suppression of microvoids formation. In Fe-8%Cr, small vacancy-type dislocation loops were formed by isochronal annealing test.

リンク情報
DOI
https://doi.org/10.1088/1742-6596/443/1/012031
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000321739400031&DestApp=WOS_CPL
ID情報
  • DOI : 10.1088/1742-6596/443/1/012031
  • ISSN : 1742-6588
  • Web of Science ID : WOS:000321739400031

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