2020年9月1日
Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
Journal of Synchrotron Radiation
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- 巻
- 27
- 号
- 5
- 開始ページ
- 1366
- 終了ページ
- 1371
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1107/s1600577520009868
- 出版者・発行元
- International Union of Crystallography (IUCr)
This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged.
- リンク情報
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- DOI
- https://doi.org/10.1107/s1600577520009868
- PubMed
- https://www.ncbi.nlm.nih.gov/pubmed/32876613
- URL
- http://journals.iucr.org/s/issues/2020/05/00/wz5010/wz5010.pdf
- Scopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85090271733&origin=inward 本文へのリンクあり
- Scopus Citedby
- https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85090271733&origin=inward
- ID情報
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- DOI : 10.1107/s1600577520009868
- ISSN : 0909-0495
- eISSN : 1600-5775
- PubMed ID : 32876613
- SCOPUS ID : 85090271733