論文

2018年2月2日

Investigation on Single-Molecule Junctions Based on Current–Voltage Characteristics

Micromachines
  • Yuji Isshiki
  • ,
  • Yuya Matsuzawa
  • ,
  • Shintaro Fujii
  • ,
  • Manabu Kiguchi

9
2
開始ページ
67
終了ページ
67
記述言語
掲載種別
研究論文(学術雑誌)
DOI
10.3390/mi9020067
出版者・発行元
{MDPI} {AG}

The relationship between the current through an electronic device and the voltage across its terminals is a current-voltage characteristic (I-V) that determine basic device performance. Currently, I-V measurement on a single-molecule scale can be performed using break junction technique, where a single molecule junction can be prepared by trapping a single molecule into a nanogap between metal electrodes. The single-molecule I-Vs provide not only the device performance, but also reflect information on energy dispersion of the electronic state and the electron-molecular vibration coupling in the junction. This mini review focuses on recent representative studies on I-Vs of the single molecule junctions that cover investigation on the single-molecule diode property, the molecular vibration, and the electronic structure as a form of transmission probability, and electronic density of states, including the spin state of the single-molecule junctions. In addition, thermoelectronic measurements based on I-Vs and identification of the charged carriers (i.e., electrons or holes) are presented. The analysis in the single-molecule I-Vs provides fundamental and essential information for a better understanding of the single-molecule science, and puts the single molecule junction to more practical use in molecular devices.

リンク情報
DOI
https://doi.org/10.3390/mi9020067
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85041505918&origin=inward 本文へのリンクあり
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85041505918&origin=inward
ID情報
  • DOI : 10.3390/mi9020067
  • ISSN : 2072-666X
  • eISSN : 2072-666X
  • ORCIDのPut Code : 87579878
  • SCOPUS ID : 85041505918

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