MISC

2009年7月

Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy

APPLIED SURFACE SCIENCE
  • Toshihiro Isobe
  • ,
  • Yosuke Nakano
  • ,
  • Yoshikazu Kameshima
  • ,
  • Akira Nakajima
  • ,
  • Kiyoshi Okada

255
20
開始ページ
8710
終了ページ
8713
記述言語
英語
掲載種別
速報,短報,研究ノート等(学術雑誌)
DOI
10.1016/j.apsusc.2009.06.050
出版者・発行元
ELSEVIER SCIENCE BV

The repulsive force originating from steric hindrance of polymers in aqueous solvent was investigated using scanning probe microscopy (SPM). The contact angle (CA) of ammonium poly(acrylic acid) (PAA) solution on the Si surface was measured to estimate the state of the Si substrate. Results of CA measurement show that the Si surface was fully covered with PAA at 0.1 mass% in aqueous solution. The interaction force between the Si tip and the wafer was estimated using the SPM force curve mode. The force curve measured in the ion-exchanged purified water showed the typical relation predicted by Derjaguin-Landau-Verway-Overbeek (DLVO) theory. However, the force curve shape in the 0.1 mass% PAA solution was significantly different. Only a repulsive force was observed at less than about 4 nm of separation distance between the Si wafer and cantilever tip. This distance originated from the steric repulsions of PAA adsorbed onto the Si wafer and cantilever tip. Crown Copyright (C) 2009 Published by Elsevier B. V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.apsusc.2009.06.050
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000268123800069&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.apsusc.2009.06.050
  • ISSN : 0169-4332
  • Web of Science ID : WOS:000268123800069

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