論文

査読有り 本文へのリンクあり
2020年8月1日

In situ observation of electrochemical phenomena by high speed scanning probe microscope

Japanese Journal of Applied Physics
  • Hisayoshi Matsushima

59
SN
記述言語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.35848/1347-4065/ab9587

© 2020 The Japan Society of Applied Physics. Electronic devices such as MEMS and micro-actuator have been developed by using nanotechnology. It is important to control the surface structure at high precision and speed on an atomic scale, which requires to clarify the dynamics processes at electrode surfaces. This review introduces an overview of in situ studies by two types of high speed scanning probe microscopes. One is the video rate scanning tunneling microscope demonstrating the growth dynamics during metal electrodeposition and surface reconstruction during gas evolution. The electrochemical phenomena can be discussed in tens of milliseconds and atomic resolution. The other is high speed atomic force microscope, presenting polymer adsorption and metal nucleation under less tip effects.

リンク情報
DOI
https://doi.org/10.35848/1347-4065/ab9587
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https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85088565598&origin=inward 本文へのリンクあり
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