論文

査読有り
2005年

XAFS study on silica glasses irradiated by high-energy particles

Physica Scripta T
  • Tomoko Yoshida
  • ,
  • Tetsuo Tanabe
  • ,
  • Hisao Yoshida

T115
開始ページ
435
終了ページ
438
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1238/Physica.Topical.115a00435

X-ray absorption technique was applied to analyze the local structures of fused and synthesized silica glasses before and after irradiation in a nuclear reactor. Si K-edge EXAFS revealed changes in the SiO4 tetrahedron structure by the irradiation, i.e. a distorted tetrahedron in the silica glass returned to more regular one but the connection between neighboring tetrahedrons became looser. In addition, the detailed analysis of EXAFS spectra gave evidence for the formation of direct Si-Si bonding after prolonged irradiation, suggesting the appearance of Si precipitates in silica glass. © Physica Scripta 2005.

リンク情報
DOI
https://doi.org/10.1238/Physica.Topical.115a00435
ID情報
  • DOI : 10.1238/Physica.Topical.115a00435
  • ISSN : 0281-1847
  • SCOPUS ID : 40849095697

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