論文

2021年8月

Improvement of Non-Uniform Temperature Distributions in Intrinsic Josephson Junction Stacks

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
  • Dai Oikawa
  • ,
  • Keita Tsuzuki
  • ,
  • Yuki Kumagai
  • ,
  • Haruki Mitarai
  • ,
  • Hiroya Andoh
  • ,
  • Toko Sugiura
  • ,
  • Takehiko Tsukamoto

31
5
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/TASC.2021.3055448
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Terahertz (THz) electromagnetic (EM) wave emitters have been expected for applications because these waves are suitable for non-destructive inspection, telecommunication technologies, and other uses. Strong and coherent THz EM waves are known to radiate from large-sized intrinsic Josephson junction (IJJ) stacks in which the self-heating effect is considerably larger and the temperatures in the mesa are non-uniformly distributed. In this study, we numerically investigate and discuss the temperature and current distributions in large-sized IJJ stacks because these parameters are difficult to analyze through experimental investigation. The temperature and current distributions can be obtained by self-consistently solving the non-linear diffusion equation in an equivalent circuit of the mesa by considering the temperature dependence of several parameters. As shown in the numerical results, self-heating caused the local temperature of the center in the mesa to exceed the critical temperature. To improve the non-uniform temperature and current distributions, we propose an improvement in which an external heat generation system is placed on the edges of the mesa. By applying this measure, the temperature distribution is improved because the edges of the IJJ mesa are heated externally. Furthermore, the local temperatures throughout the mesa were held below voltage characteristics were improved using the proposed improvement.

リンク情報
DOI
https://doi.org/10.1109/TASC.2021.3055448
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000635440900001&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/TASC.2021.3055448
  • ISSN : 1051-8223
  • eISSN : 1558-2515
  • Web of Science ID : WOS:000635440900001

エクスポート
BibTeX RIS