2014年
Clean Surface Processing of Rubrene Single Crystal Immersed in Ionic Liquid by Using Frequency Modulation Atomic Force Microscopy
Appl. Phys. Lett.
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- 巻
- 104
- 号
- 26
- 開始ページ
- 263102
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.4886154
Surface processing of a rubrene single crystal immersed in ionic liquids is valuable for further development of low voltage transistors operated by an electric double layer. We performed a precise and clean surface processing based on the tip-induced dissolution of rubrene molecules at the ionic liquid/rubrene single crystal interfaces by using frequency modulation atomic force microscopy. Molecular resolution imaging revealed that the tip-induced dissolution proceeded via metastable low density states derived from the anisotropic intermolecular interactions within the crystal structure. © 2014 AIP Publishing LLC.
- リンク情報
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- DOI
- https://doi.org/10.1063/1.4886154
- J-GLOBAL
- https://jglobal.jst.go.jp/detail?JGLOBAL_ID=201402249249236560
- Scopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84905656650&origin=inward
- Scopus Citedby
- https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=84905656650&origin=inward
- ID情報
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- DOI : 10.1063/1.4886154
- ISSN : 0003-6951
- J-Global ID : 201402249249236560
- SCOPUS ID : 84905656650