論文

査読有り
2014年

High-frequency ESR measurements and ESR/NMR double resonance experiments of lightly phosphorous-doped silicon

27TH INTERNATIONAL CONFERENCE ON LOW TEMPERATURE PHYSICS (LT27), PTS 1-5
  • Y. Fujii
  • ,
  • S. Mitsudo
  • ,
  • K. Morimoto
  • ,
  • T. Mizusaki
  • ,
  • M. Gwak
  • ,
  • S. G. Lee
  • ,
  • A. Fukuda
  • ,
  • A. Matsubara
  • ,
  • T. Ueno
  • ,
  • S. Lee

568
開始ページ
42004
終了ページ
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1088/1742-6596/568/4/042005
出版者・発行元
IOP PUBLISHING LTD

We studied lightly doped Si:P with high-frequency (80-120 GHz) ESR and ESR/NMR double magnetic resonance techniques in the temperature range down to 1.4 K. We found dynamic nuclear polarization of P-31 from steady-state ESR measurements with approximately 3.6 T. We derived the nuclear spin relaxation time, T-1N, of P-31 by analysing the time-evolution of ESR spectra utilizing the dynamic nuclear polarization effect. We derive temperature and magnetic field dependence of T-1N and compare with experimental data. Furthermore, from our ESR measurements, we modulate the nuclear polarization of P-31 by applying an RF field.

リンク情報
DOI
https://doi.org/10.1088/1742-6596/568/4/042005
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000351433700105&DestApp=WOS_CPL
ID情報
  • DOI : 10.1088/1742-6596/568/4/042005
  • ISSN : 1742-6588
  • Web of Science ID : WOS:000351433700105

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