論文

査読有り
2008年

ESD ground test of solar array coupons for a greenhouse gases observing satellite in PEO

IEEE Transactions on Plasma Science
  • Kazuhiro Toyoda
  • ,
  • Hirokazu Masui
  • ,
  • Takanobu Muranaka
  • ,
  • Mengu Cho
  • ,
  • Tomoyuki Urabe
  • ,
  • Takeshi Miura
  • ,
  • Shirou Kawakita
  • ,
  • Yuichiro Gonohe
  • ,
  • Tooru Kikuchi

36
5 PART 2
開始ページ
2413
終了ページ
2424
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/TPS.2008.2002823
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

An electrostatic discharge test was carried out on a solar array paddle (SAP) for the Greenhouse gases Observing SATellite (GOSAT) on a simulated polar Earth orbit (PEO) environment. To simulate the spacecraft charging conditions in a PEO with an auroral band, when electrons with higher energy than LEO plasma flow to the Earth, three conditions of dielectric charging can be considered on each side of the SAP. At first, the threshold voltage differences of discharge inception were measured experimentally using solar array coupons simulating both the beginning and the end of life under six charging conditions. Next, the Multiutility Spacecraft Charging Analysis Tool was employed to analyze the spacecraft surface potential and the time needed for charging. From the threshold value and the charging analysis, the probability and the number of discharges were estimated in each charging condition during a lifetime of the GOSAT. Finally, the performance of the coupons against discharges was evaluated for each charging condition. All coupons had no sustained arc during these tests; however, there was some electrical degradation of the solar cell. The power degradation during the lifetime of the GOSAT was estimated from these results, and the design of the solar array coupon was confirmed to satisfy the power demand even if the estimated number of discharges occurs in the lifetime. © 2008 IEEE.

リンク情報
DOI
https://doi.org/10.1109/TPS.2008.2002823
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000261363200023&DestApp=WOS_CPL
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=59749084341&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=59749084341&origin=inward
ID情報
  • DOI : 10.1109/TPS.2008.2002823
  • ISSN : 0093-3813
  • SCOPUS ID : 59749084341
  • Web of Science ID : WOS:000261363200023

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