2004年6月
The branching ratio of anions in thermal electron attachment to chlorinated fluorobenzenes
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
- 巻
- 235
- 号
- 1
- 開始ページ
- 1
- 終了ページ
- 5
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/j.ijms.2004.03.001
- 出版者・発行元
- ELSEVIER SCIENCE BV
The temperature dependences of the formation of negative ions from C6F6-xClx, CF3C6F5-xClx, and NC5F5-xClx (x = 1,2) were studied using negative chemical ionization mass spectrometry. Cl- and the parent negative ion were produced. The (M - Cl)(-) (M: parent molecule) was also observed for CF3C6F5-xClx and NC5F5-xClx. The temperature dependence of the relative intensity, (M - Cl)(-)/Cl-, suggested that the electron affinity of the fragment radicals decreases in the order, CF3C6F4 > C5F4N > C6F5. On the other hand, the relative intensity, Cl-/M-, suggested that the electron affinity of the parent molecules decreases in the order, CF3C6F5-xClx much greater than NC5F5-xClx > C6F6-xClx. Geometries of the parent anions were also calculated using with B3LYP/6-31+G method. The parent anions have an out-of-plane deformed structure and the extent of the deformation corresponds to that of the electron affinity for the parent molecule. (C) 2004 Elsevier B.V. All rights reserved.
- リンク情報
- ID情報
-
- DOI : 10.1016/j.ijms.2004.03.001
- ISSN : 1387-3806
- Web of Science ID : WOS:000221948400001