論文

査読有り
2004年6月

The branching ratio of anions in thermal electron attachment to chlorinated fluorobenzenes

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
  • S Nakagawa

235
1
開始ページ
1
終了ページ
5
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.ijms.2004.03.001
出版者・発行元
ELSEVIER SCIENCE BV

The temperature dependences of the formation of negative ions from C6F6-xClx, CF3C6F5-xClx, and NC5F5-xClx (x = 1,2) were studied using negative chemical ionization mass spectrometry. Cl- and the parent negative ion were produced. The (M - Cl)(-) (M: parent molecule) was also observed for CF3C6F5-xClx and NC5F5-xClx. The temperature dependence of the relative intensity, (M - Cl)(-)/Cl-, suggested that the electron affinity of the fragment radicals decreases in the order, CF3C6F4 > C5F4N > C6F5. On the other hand, the relative intensity, Cl-/M-, suggested that the electron affinity of the parent molecules decreases in the order, CF3C6F5-xClx much greater than NC5F5-xClx > C6F6-xClx. Geometries of the parent anions were also calculated using with B3LYP/6-31+G method. The parent anions have an out-of-plane deformed structure and the extent of the deformation corresponds to that of the electron affinity for the parent molecule. (C) 2004 Elsevier B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.ijms.2004.03.001
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000221948400001&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.ijms.2004.03.001
  • ISSN : 1387-3806
  • Web of Science ID : WOS:000221948400001

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