MISC

2007年

Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with on-Chip Delay Measurement

IEEE Trans. on Circuits and Systems—II: Express Briefs

vol. 54, no. 10, pp. 868-872
DOI
10.1109/TCSII.2007.901574

リンク情報
DOI
https://doi.org/10.1109/TCSII.2007.901574
ID情報
  • DOI : 10.1109/TCSII.2007.901574

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