論文

査読有り
2003年

Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control

OPTICS FOR THE QUALITY OF LIFE, PTS 1 AND 2
  • O Sasaki
  • ,
  • K Akiyama
  • ,
  • T Suzuki

4829
開始ページ
853
終了ページ
855
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
出版者・発行元
SPIE-INT SOC OPTICAL ENGINEERING

Phase modulation amplitude Z(b) caused by a sinusoidal wavelength-scanning and conventional phase alpha of an interference signal are kept at pi and 3pi/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scanning becomes a ruler marked out every a wavelength. Real-time distance measurement is. carried outwith this interferometer.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000188036900400&DestApp=WOS_CPL
ID情報
  • ISSN : 0277-786X
  • Web of Science ID : WOS:000188036900400

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