2003年
Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control
OPTICS FOR THE QUALITY OF LIFE, PTS 1 AND 2
- ,
- ,
- 巻
- 4829
- 号
- 開始ページ
- 853
- 終了ページ
- 855
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- 出版者・発行元
- SPIE-INT SOC OPTICAL ENGINEERING
Phase modulation amplitude Z(b) caused by a sinusoidal wavelength-scanning and conventional phase alpha of an interference signal are kept at pi and 3pi/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scanning becomes a ruler marked out every a wavelength. Real-time distance measurement is. carried outwith this interferometer.
- リンク情報
- ID情報
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- ISSN : 0277-786X
- Web of Science ID : WOS:000188036900400