MISC

2004年3月

Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope

OPTICS COMMUNICATIONS
  • Y Yasuno
  • ,
  • TF Wiesendanger
  • ,
  • AK Ruprecht
  • ,
  • S Makita
  • ,
  • T Yatagai
  • ,
  • HJ Tiziani

232
1-6
開始ページ
91
終了ページ
97
記述言語
英語
掲載種別
DOI
10.1016/j.optcom.2003.12.057
出版者・発行元
ELSEVIER SCIENCE BV

A simple wavefront evaluation method is proposed which employs only one Fourier transform lens, one CCD camera and a digital signal processing procedure. The optical setup is sufficiently simple to be used in numerous types of optical systems. The feasibility of the method is demonstrated in an adaptive confocal microscope which dynamically corrects aberrations. This confocal microscope contains a deformable membrane mirror whose shape is optimized using a genetic algorithm and a wavefront evaluation method. (C) 2003 Elsevier B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.optcom.2003.12.057
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000189215100012&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.optcom.2003.12.057
  • ISSN : 0030-4018
  • Web of Science ID : WOS:000189215100012

エクスポート
BibTeX RIS