2006年
Analysis of BGA defects by tomographic images
SIGNAL ANALYSIS, MEASUREMENT THEORY, PHOTO-ELECTRONIC TECHNOLOGY, AND ARTIFICIAL INTELLIGENCE, PTS 1 AND 2
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- 巻
- 6357
- 号
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1117/12.716986
- 出版者・発行元
- SPIE-INT SOC OPTICAL ENGINEERING
To improve the cost of performance in manufacturing IC packages, it is required to inspect BGA defects in the online process. The problems of image analysis for the detection of defects are the detection accuracy and image processing time according to a line speed of production. Using the X-ray penetration equipment, we have captured images of an IC package to search an abnormal BGA. To get design data for the development of the inspection system, which can be used easily in the surface mount process, we tried to capture the tomographic images utilizing the latest imaging techniques.
- リンク情報
- ID情報
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- DOI : 10.1117/12.716986
- ISSN : 0277-786X
- eISSN : 1996-756X
- Web of Science ID : WOS:000243123200059