論文

査読有り
2009年6月

Development of Cu Substrate for Low Cost Coated Conductors

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
  • Naoji Kashima
  • ,
  • Kunihiro Shima
  • ,
  • Toshiya Doi
  • ,
  • Shuichi Kubota
  • ,
  • Tomonori Watanabe
  • ,
  • Masayoshi Inoue
  • ,
  • Tananobu Kiss
  • ,
  • Shigeo Nagaya

19
3
開始ページ
3299
終了ページ
3302
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/TASC.2009.2018263
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

A textured Cu {100} < 001 > substrate for practical use in low cost coated conductor applications has been successfully fabricated. A textured Cu substrate is a promising substrate for a coated conductor template. This is the result of a low material cost base, no magnetization loss and good electro conductivity. One of the issues for a Cu substrate is surface oxidation. During REBCO deposition, the Cu substrate is exposed to an oxygen atmosphere, and de-lamination of the buffer layer can occur. To prevent this issue a thin Ni layer was formed on the textured Cu substrate by electroplating. After a further annealing process the Ni electroplated Cu substrates exhibit a good sharp texture and a smoother surface. The Delta phi and Delta omega of the substrate were about 4.6 and 4.5 degrees, respectively. The surface roughness was estimated at 6.8 nm Ra by AFM. Using this substrate and clad type Cu/SUS316 substrates, we deposited a CeO(2)/YSZ/CeO(2) layer by Pulsed Laser Deposition (PLD) and an YBa(2)Cu(3)O(7-delta) layer by PLD and Metal-Organic Chemical Vapor Deposition (MOCVD). The results show no occurrence of de-lamination. Typical critical temperature of the coated conductors was 90.5 K and critical current density was a maximum of 4.5 MA/cm(2) (at 77 K in a self-field).

リンク情報
DOI
https://doi.org/10.1109/TASC.2009.2018263
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000268282200183&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/TASC.2009.2018263
  • ISSN : 1051-8223
  • eISSN : 1558-2515
  • Web of Science ID : WOS:000268282200183

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