1996年4月1日
Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8
Physica B: Condensed Matter
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- 巻
- 219-220
- 号
- 1-4
- 開始ページ
- 216
- 終了ページ
- 218
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1016/0921-4526(95)00700-8
- 出版者・発行元
- Elsevier
Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C11 - C12)/2 in single-crystalline La2 - xSrxCuO4 only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain εxx - εyy.
- ID情報
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- DOI : 10.1016/0921-4526(95)00700-8
- ISSN : 0921-4526
- SCOPUS ID : 13544260008