2004年
L.Chouanine,M.Takano, F.Ashihara,O.Kamiya Nanoidentation/Scratch characterization of Ti(20nm)-Pt(10nm)-Au(100nm) in MEMS Device
Japan-Tunisia Workshop on Computer Systems and Information Technology(University of Electro-Communications,Tokyo,Japan)
- 巻
- Proc. of JT-CSIT' 04 (78-83)
- 号