論文

2018年

Characterizing of corrosion backside of steel plates using extremely low-frequency eddy current testing with multiple-frequency magnetic-field exposure

Studies in Applied Electromagnetics and Mechanics
  • Tsuyoshi Goda
  • ,
  • Yuta Haga
  • ,
  • Takuya Tomioka
  • ,
  • Kenji Sakai
  • ,
  • Toshihiko Kiwa
  • ,
  • Keiji Tsukada

43
開始ページ
130
終了ページ
135
記述言語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.3233/978-1-61499-836-5-130

© 2018 The authors and IOS Press. In recent years, aging and deterioration of social infrastructure has become a major problem. A non-destructive testing technique for early detection of degradation (such as internal corrosion) is required to extend the lifetime of these structures. Currently, there are various methods used for inspection. Among these, non-destructive testing using magnetic fields is widely used due to advantages such as ease of use and high speed. However, magnetic inspection is generally employed only for inspection of the surface and subsurface, since it is difficult to inspect internal corrosion using this technique. Therefore, we have developed a device for detecting thinning of steel plates due to corrosion using multiple extremely-low frequencies and a high-sensitivity magnetic sensor. However, it is necessary to sweep multiple frequencies to obtain a frequency spectrum, and this is very timeconsuming, especially in extremely low-frequency ranges. In this study, we have developed an analysis method based on a multiple-frequency applied magnetic field and FFT (fast Fourier transform) analysis of the detection signal. Thus, we have successfully reduced the measurement time while maintaining high detection accuracy.

リンク情報
DOI
https://doi.org/10.3233/978-1-61499-836-5-130
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85050569966&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85050569966&origin=inward
ID情報
  • DOI : 10.3233/978-1-61499-836-5-130
  • ISSN : 1383-7281
  • eISSN : 1879-8322
  • SCOPUS ID : 85050569966

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