2014年5月
A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam
SCIENTIFIC REPORTS
- 巻
- 4
- 号
- 開始ページ
- 5072
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1038/srep05072
- 出版者・発行元
- NATURE PUBLISHING GROUP
The recent development of the intense pulsed muon source at J-PARC MUSE, Japan Proton Accelerator Research Complex/MUon Science Establishment (10(6) s(-1) for a momentum of 60 MeV/c), enabled us to pioneer a new frontier in analytical sciences. Here, we report a non-destructive elemental analysis using mu-capture. Controlling muon momentum from 32.5 to 57.5 MeV/c, we successfully demonstrate a depth-profile analysis of light elements (B, C, N, and O) from several mm-thick layered materials and non-destructive bulk analyses of meteorites containing organic materials. Muon beam analysis, enabling a bulk analysis of light to heavy elements without severe radioactivation, is a unique analytical method complementary to other non-destructive analyses. Furthermore, this technology can be used as a powerful tool to identify the content and distribution of organic components in future asteroidal return samples.
- リンク情報
- ID情報
-
- DOI : 10.1038/srep05072
- ISSN : 2045-2322
- Web of Science ID : WOS:000336364900003