論文

査読有り
2007年8月

Imaging of local stiffness of damaged polycrystalline copper: Nondestructive evaluation by resonance ultrasound microscopy

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL
  • Hirotsugu Ogi
  • ,
  • Noritaka Hayama
  • ,
  • Hiroki Niho
  • ,
  • Masahiko Hirao
  • ,
  • Tomohiro Morishita

54
8
開始ページ
1514
終了ページ
1520
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/TUFFC.2007.421
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

The distribution of the local stiffness of a polycrystalline copper exposed to a creep test was studied by resonance ultrasound microscopy. The local effective modulus was evaluated from the resonance frequency of the isolated langasite oscillator touching the specimen. Defects appeared predominantly on grain boundaries, and they were clearly visualized by the stiffness microscopy through the significant decrease of the effective stiffness. The stiffness within the grains becomes lower regardless of invisible defects. The stiffness distribution was quantitatively analyzed by the contact model between two anisotropic bodies and by the micromechanics modeling. The microscopic stiffness shows much higher sensitivity to the defects than the macroscopic stiffness.

リンク情報
DOI
https://doi.org/10.1109/TUFFC.2007.421
CiNii Articles
http://ci.nii.ac.jp/naid/80018358743
PubMed
https://www.ncbi.nlm.nih.gov/pubmed/17703654
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000248352500003&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/TUFFC.2007.421
  • ISSN : 0885-3010
  • CiNii Articles ID : 80018358743
  • PubMed ID : 17703654
  • Web of Science ID : WOS:000248352500003

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