2007年8月
Imaging of local stiffness of damaged polycrystalline copper: Nondestructive evaluation by resonance ultrasound microscopy
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL
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- 巻
- 54
- 号
- 8
- 開始ページ
- 1514
- 終了ページ
- 1520
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1109/TUFFC.2007.421
- 出版者・発行元
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
The distribution of the local stiffness of a polycrystalline copper exposed to a creep test was studied by resonance ultrasound microscopy. The local effective modulus was evaluated from the resonance frequency of the isolated langasite oscillator touching the specimen. Defects appeared predominantly on grain boundaries, and they were clearly visualized by the stiffness microscopy through the significant decrease of the effective stiffness. The stiffness within the grains becomes lower regardless of invisible defects. The stiffness distribution was quantitatively analyzed by the contact model between two anisotropic bodies and by the micromechanics modeling. The microscopic stiffness shows much higher sensitivity to the defects than the macroscopic stiffness.
- リンク情報
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- DOI
- https://doi.org/10.1109/TUFFC.2007.421
- CiNii Articles
- http://ci.nii.ac.jp/naid/80018358743
- PubMed
- https://www.ncbi.nlm.nih.gov/pubmed/17703654
- Web of Science
- https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000248352500003&DestApp=WOS_CPL
- ID情報
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- DOI : 10.1109/TUFFC.2007.421
- ISSN : 0885-3010
- CiNii Articles ID : 80018358743
- PubMed ID : 17703654
- Web of Science ID : WOS:000248352500003