論文

査読有り
2017年10月

Straightforward Measurement Method of Common Source Inductance for Fast Switching Semiconductor Devices Mounted on Board

IEEE Transactions on Industrial Electronics
  • Kazuhiro Umetani
  • ,
  • Kyota Aikawa
  • ,
  • Eiji Hiraki

64
10
開始ページ
8258
終了ページ
8267
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/TIE.2017.2694411
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

© 1982-2012 IEEE. Recent progress of widebandgap semiconductor switching devices enabled extremely high-frequency operation of power converters owing to their ultrafast switching capability. Fast switching may cause large switching noise at the common source inductance, which may increase the switching loss and lead to false triggering. Therefore, measurement of the common source inductance is often intensely required in practical design of fast switching power converters. However, measurement of the common source inductance is difficult, because 1) the wiring path hidden beneath the molded package significantly contributes to this inductance, 2) the mutual inductance between the gating circuit and the power circuit also contributes to this inductance, and 3) this inductance cannot be defined as the stray inductance of a loop wiring path. These difficulties are addressed in this paper by proposing a novel measurement method of the common source inductance. The proposed method is applicable to already-mounted power circuits. In addition, the proposed method offers a straightforward measurement procedure with common instruments, such as a signal generator, an oscilloscope, and voltage and current probes. Along with the measurement principle, this paper also presents an experiment to evaluate the proposed method.

リンク情報
DOI
https://doi.org/10.1109/TIE.2017.2694411
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000410160200064&DestApp=WOS_CPL
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85029912894&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85029912894&origin=inward
ID情報
  • DOI : 10.1109/TIE.2017.2694411
  • ISSN : 0278-0046
  • eISSN : 1557-9948
  • ORCIDのPut Code : 33996470
  • SCOPUS ID : 85029912894
  • Web of Science ID : WOS:000410160200064

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