2018年3月1日
In situ characterization of the film coverage and the charge transport in the alkylated-organic thin film transistor
Japanese Journal of Applied Physics
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- 巻
- 57
- 号
- 3
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- DOI
- 10.7567/JJAP.57.03EG14
- 出版者・発行元
- Japan Society of Applied Physics
We propose an in situ experimental method of investigating the correlations of the film coverage of the organic semiconductor layers and charge transport properties of organic thin film transistors during vacuum deposition. The coverage of each monolayer was estimated using the intensity of off-specular diffuse scattering and diffraction. Experimental data were obtained from the in situ measurements of two-dimensional grazing incidence X-ray scattering and charge transport. The source-drain current increased over the film coverage of the first monolayer (= 0.48). This is in agreement with the critical percolation coverage, indicating that the conductivities of the first and second monolayers are different.
- リンク情報
- ID情報
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- DOI : 10.7567/JJAP.57.03EG14
- ISSN : 1347-4065
- ISSN : 0021-4922
- ORCIDのPut Code : 48944958
- SCOPUS ID : 85042675279