論文

査読有り
2019年12月

Study of multiple impurity seeding effect using SONIC integrated divertor code for JT-60SA plasma prediction

CONTRIBUTIONS TO PLASMA PHYSICS
  • Yamoto, Shohei
  • ,
  • Hoshino, Kazuo
  • ,
  • Homma, Yuki
  • ,
  • Nakano, Tomohide
  • ,
  • Hayashi, Nobuhiko

記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1002/ctpp.201900146
出版者・発行元
WILEY-V C H VERLAG GMBH

In order to study the potential impurity seeding operation regime of the future fusion devices, the first application of the integrated divertor code SONIC to the Ar + Ne mixed-impurity seeding operation of JT-60SA steady-state high-beta plasma has been carried out. In the case, Ne is added to Ar-only seeding, the separatrix electron density has fell into the desired low separatrix electron density of the scenario. This is mainly because the D+ flow velocity towards the inner divertor has been increased by the Ne seeding. The resultant friction force transports Ar impurities towards the inner divertor region, while impurities are stagnated in the top of scrape-off layer (SOL) in the Ar-only seeding case. The higher impurity radiation power in the divertor regions and lower one in the SOL region above the X point have been obtained in mixed-impurity seeding cases, which show similar tendency as the Ar + Ne mixed-impurity seeding experiment in JT-60 U. At the core edge, Z(eff) has been slightly increased and the radiation power has been decreased as the Ne seeding rate increases. The core plasma/impurity transport has been also evaluated by the TOPICS code using the impurity density at the core edge computed by the SONIC as a boundary parameter. The results show lower Z(eff) and radiation power, and higher electron temperature in the core in the mixed-impurity seeding cases. Above possible contributors to the better energy confinement indicate that the mixed-impurity seeding operation might be more effective than Ar-only seeding operation.

リンク情報
DOI
https://doi.org/10.1002/ctpp.201900146
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000504300100001&DestApp=WOS_CPL
ID情報
  • DOI : 10.1002/ctpp.201900146
  • ISSN : 0863-1042
  • eISSN : 1521-3986
  • Web of Science ID : WOS:000504300100001

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