2010年10月
SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials
SURFACE AND INTERFACE ANALYSIS
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- 巻
- 42
- 号
- 10-11
- 開始ページ
- 1612
- 終了ページ
- 1615
- 記述言語
- 英語
- 掲載種別
- 研究論文（学術雑誌）
- DOI
- 10.1002/sia.3585
- 出版者・発行元
- JOHN WILEY & SONS LTD
Recent developments in SIMS with both Ar cluster ions and swift heavy ions are presented. With these primary beams, the analysis of organic semiconductors and animal cells shows that one of the key factors to realizing the SIMS analysis of organic materials is high-energy deposition near the surface. Molecular depth profiling and images of organic materials were demonstrated by using SIMS. Copyright (C) 2010 John Wiley & Sons, Ltd.
- リンク情報
- ID情報
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- DOI : 10.1002/sia.3585
- ISSN : 0142-2421
- Web of Science ID : WOS:000282668800023