The strain dependence of the critical current, I-c, of Bi2223/Ag/Ag-alloy composite superconducting tapes has been studied both experimentally and analytically under bending deformation for two types of tape used in the VAMAS bending round-robin program (classified as VAM1 and 3). Our former analysis showed that the experimentally obtained I-c values were between the calculated ones based on a damage-free initial state and a case where delamination occupied the full width of the tape mid-plane. The experimentally obtained I-c values were explained by the delamination occupying partial width of the tape mid-plane. However, the microscopic observation indicated that the delamination location in the thickness direction was not limited to the mid-plane. In the present study, the analysis was modified to incorporate the movement of the delamination location in the thickness direction. The calculated I-c values with delamination increased when the delamination location moved to compressive side of the tape, and decreased when that moved to tensile side of the tape. Finally, the experimental I-c values can be understood by the distribution of delamination in both width and thickness direction.