論文

査読有り
2008年

Hard X-ray characterization of the NeXT hard X-ray telescopes at SPring-8

SPACE TELESCOPES AND INSTRUMENTATION 2008: ULTRAVIOLET TO GAMMA RAY, PTS 1 AND 2
  • Takuya Miyazawa
  • Yasushi Ogasaka
  • Tomonaga Iwahara
  • Yasufumi Kanou
  • Naoki Sasaki
  • Youta Makinae
  • Shiori Sasaya
  • Yuuki Inukai
  • Akihiro Furuzawa
  • Yoshito Haba
  • Hideyo Kunieda
  • Koujun Yamashita
  • Kentaro Uesugi
  • Yoshio Suzuki
  • Keisuke Tamura
  • Yoshitomo Maeda
  • Manabu Ishida
  • Takashi Okajima
  • 全て表示

7011
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1117/12.788606
出版者・発行元
SPIE-INT SOC OPTICAL ENGINEERING

We present a plan for calibration of the NeXT hard X-ray telescopes (HXTs) at the synchrotron radiation facility, SPring-8. In hard X-rays, it is difficult for a laboratory-based beamline using a conventional X-ray source to provide sufficient capabilities for pre-flight high-precision calibration. Therefore, we plan to characterize the NeXT HXT at the SPring-8 beamline BL20B2. SPring-8 is one of the world's third-generation synchrotron radiation facilities. Measurements at BL20B2 have great advantages over those done with conventional sources, such as an extremely high flux, a larger beam with less divergence, and a selectable, narrow bandwidth covering the hard X-ray region from 8 to over 100 keV. The 16m-long experimental hutch has sufficient capability for characterization of the NeXT HXT (FL=12m). In the past, we have measured the Point Spread Function (PSF) and effective area of telescopes for balloon-borne hard X-ray imaging experiments (e.g. InFOCuS, SUMIT) at several energies from 20 to 60 keV. Furthermore, we have successfully established a tuning procedure to improve their image quality. We plan to measure the X-ray characteristics (PSF, effective area, stray light, and so on) of the NeXT HXT to build up the HXT response function.

リンク情報
DOI
https://doi.org/10.1117/12.788606
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000259563700076&DestApp=WOS_CPL
ID情報
  • DOI : 10.1117/12.788606
  • ISSN : 0277-786X
  • eISSN : 1996-756X
  • Web of Science ID : WOS:000259563700076

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